Lower confidence limits for process capability indices Cp and Cpk when data are autocorrelated |
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Authors: | Cynthia R. Lovelace James J. Swain Hisham Zeinelabdin Jatinder N. D. Gupta |
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Affiliation: | 1. The University of Alabama, Huntsville, AL, U.S.A.;2. Clinical Assistant Professor.;3. Member of ASA.;4. Department of Industrial and Systems Engineering and Engineering Management, The University of Alabama, Huntsville, AL, U.S.A.;5. Professor and Department chair of the Industrial and System Engineering/Engineering Management Department.;6. Senior Member of IIE.;7. Member of POMS, DSI, and IIE.;8. Professor and Eminent Scholar in Management of Technology at University of Alabama, Huntsville. |
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Abstract: | Many organizations use a single estimate of Cp and/or Cpk for process benchmarking, without considering the sampling variability of the estimators and how that impacts the probability of meeting minimum index requirements. Lower confidence limits have previously been determined for the Cp and Cpk indices under the standard assumption of independent data, which are based on the sampling distributions of the index estimators. In this paper, lower 100(1‐α)% confidence limits for Cp and Cpk were developed for autocorrelated processes. Simulation was used to generate the empirical sampling distribution of each estimator for various combinations of sample size (n), autoregressive parameter (?), true index value (Cp or Cpk), and confidence level. In addition, the minimum values of the estimators required in order to meet quality requirements with 100(1‐α)% certainty were also determined from these empirical sampling distributions. These tables may be used by practitioners to set minimum capability requirements for index estimators, rather than true values, for the autocorrelated case. The implications of these results for practitioners will be discussed. Copyright © 2008 John Wiley & Sons, Ltd. |
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Keywords: | process capability indices autocorrelated data simulation supplier certification six sigma |
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