Realistische Modellierung der NIR/VIS/UV‐optischen Konstanten dünner optischer Schichten im Rahmen des Oszillatormodells |
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Authors: | Olaf Stenzel Steffen Wilbrandt Karen Friedrich Friedrich Norbert Kaiser |
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Affiliation: | Fraunhofer Institut für Angewandte Optik und Feinmechanik IOF, Albert‐Einstein‐Str.7, 07745 Jena |
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Abstract: | Modelling the NIR/VIS/UV optical constants of thin solid films: An oscillator model approach Based on a multioscillator approach, we demonstrate the determination of optical constants of different optical coating materials. The advanced LCalc‐software allows calculating the dielectric function as well as refractive index and extinction coefficient through a fit of transmittance and reflectance spectra measured at one or several angles of incidence. Sufficiently accurate spectrophotometric measurements are carried out by means of self‐developed VN‐ The thus obtained optical constants are automatically Kramers‐Kronig‐consistent and in reasonable correspondence to various kind of side information available about the coatings. This is demonstrated for dielectric oxide coatings as well as for one transparent conductive oxide (ITO) and a metal layer (aluminium). In application to reproducibility experiments, the method allows estimating process‐inherent stochastic variations in optical constants, which represent themselves an essential input for advanced computational manufacturing runs for design optimization prior to deposition. |
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