Defect Chemistry and Electrical Properties of Thallium Oxide Single Crystals

Ehdectrical resistivity and Hall voltage were measured between 4.2 and 300 K on T1₂O₃ crystals annealehd at 550°C for 24 h under oxygen pressures of 2×10⁴ to 10⁷ Pa. The carrier concentration varied from 7.97×10²⁰ to 5.08×10²⁰ cm^?3, the low-temperature Hall mobility from 131 to 189 cm²/V.s, and the Fermi level from 7.1×10⁴ to 5.05×10⁴ J/mol above the bottom of the conduction band as P ₀₂ was increased from 2×10⁴ to 10⁷ Pa. The dependence of Fermi level on carrier concentration and P _0l was consistent with a parabolic density-of-states function describing the conduction band. Over the entire region of oxygen pressure investigated, Fermi-Dirac statistics were required to describe the dependence of carrier concentration on P ₀₂.