The combinatorial design approach to automatic test generation |
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Authors: | Cohen D.M. Dalal S.R. Parelius J. Patton G.C. |
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Affiliation: | Bellcore, NJ; |
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Abstract: | The combinatorial design method substantially reduces testing costs. The authors describe an application in which the method reduced test plan development from one month to less than a week. In several experiments, the method demonstrated good code coverage and fault detection ability |
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