Tensile creep of whisker-reinforced silicon nitride

This paper presents a study of the creep and creep rupture behaviour of hot-pressed silicon nitride reinforced with 30 vol% SiC whiskers. The material was tested in both tension and compression at temperatures ranging from 1100 to 1250°C for periods as long as 1000 h. A comparison was made between the creep behaviour of whisker-reinforced and whisker-free silicon nitride. Principal findings were: (i) transient creep due to devitrification of the intergranular phase dominates high-temperature creep behaviour; (ii) at high temperatures and stresses, cavitation at the whisker-silicon nitride interface enhances the creep rate and reduces the lifetime of the silicon nitride composite; (iii) resistance to creep deformation is greater in compression than in tension; (iv) the time to rupture is a power function of the creep rate, so that the temperature and stress dependence of the failure time is determined solely by the temperature and stress dependence of the creep rate; (v) as a consequence of differences in grain morphology and glass composition between whisker-free and whisker-reinforced material, little effect of whisker additions on the creep rate was observed.