首页 | 本学科首页   官方微博 | 高级检索  
     


Optical broadband monitoring of thin film growth
Authors:H.Ehlers  T.Groβ  M.Lappschies  D.Ristau
Affiliation:Laser Zentrum Hannover,Hollerithallee 8,30419 Hannover,Germany
Abstract:This contribution is focused on applications of spectroscopic methods for the precise control of deposition processes. In this context, the present study gives a review on selected combinations of conventional and ion deposition techniques with different broadband online spectrophotometric systems. Besides two systems operating in the VIS- and NIR-spectral range in combination with ion processes, also a monochromator system developed for conventional deposition processes in the DUV/VUV-spectral range will be discussed. The considerations will be concluded by a comparison of the major advantages of the specific combinations of processes with online monitoring concepts and by a brief outlook concerning future challenges.
Keywords:optical coating  optical broadband monitoring  ion assisted deposition  ion beam sputtering  DUV  VUV
本文献已被 CNKI 维普 万方数据 等数据库收录!
点击此处可从《光学精密工程》浏览原始摘要信息
点击此处可从《光学精密工程》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号