Optical broadband monitoring of thin film growth |
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Authors: | H.Ehlers T.Groβ M.Lappschies D.Ristau |
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Affiliation: | Laser Zentrum Hannover,Hollerithallee 8,30419 Hannover,Germany |
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Abstract: | This contribution is focused on applications of spectroscopic methods for the precise control of deposition processes. In this context, the present study gives a review on selected combinations of conventional and ion deposition techniques with different broadband online spectrophotometric systems. Besides two systems operating in the VIS- and NIR-spectral range in combination with ion processes, also a monochromator system developed for conventional deposition processes in the DUV/VUV-spectral range will be discussed. The considerations will be concluded by a comparison of the major advantages of the specific combinations of processes with online monitoring concepts and by a brief outlook concerning future challenges. |
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Keywords: | optical coating optical broadband monitoring ion assisted deposition ion beam sputtering DUV VUV |
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