| 数字调谐系统芯片DTSO614的可测性设计 |
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| 引用本文： | 居水荣,滕青.数字调谐系统芯片DTSO614的可测性设计[J].半导体技术,2002,27(9):9-13. |
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| 作者姓名： | 居水荣 滕青 |
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| 作者单位： | 1. 无锡盈泰科技有限公司,江苏,无锡,214068;2. 无锡华晶上华半导体有限公司,江苏,无锡,214061 |
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| 摘 要： | 介绍了集成电路可测性设计的概念和分类方法,然后以数字调谐系统芯片DTS0614为例,具体介绍了其中的一种即针对性可测性设计方法,包括模块划分、增加控制线和观察点.最后给出了提高电路可测性的另一种方法--内建自测试方法.
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| 关 键 词： | 可测性设计 数字调谐系统 内建自测试 |
| 文章编号： | 1003-353X(2002)09-0009-05 |
Design for testability about digital tuning system DTS0614 |
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| JU Shui-rong,TENG Qing.Design for testability about digital tuning system DTS0614[J].Semiconductor Technology,2002,27(9):9-13. |
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| Authors: | JU Shui-rong TENG Qing |
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| Abstract: | The concept and classification of design for testability about IC are introduced. One method of design for testability which called special design for testability methodology is given based on DTS0614, include module division, control line and observation point adding into the circuit. And the another way of design for testability which is build-in self test is introduced. |
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| Keywords: | design for testability digital tuning system build-in self test |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
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