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RFID-based colored Petri net applied for quality monitoring in manufacturing system |
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| Authors: | Yaqiong Lv C K M Lee H K Chan W H Ip |
| Affiliation: | 1. Mechanical and Aerospace Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore, 639798, Singapore 2. Norwich Business School, University of East Anglia, Norwich, Norfolk, UK 3. Department of Industrial and Systems Engineering, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong |
| Abstract: | Product quality is difficult to be traced and monitored in the distributed manufacturing network. This paper proposes and develops a new RFID-based CPN modeling method where the colored tokens are evolved to color-tagged tokens carrying the product information of real-time status. With this new real-time modeling method, the performance of manufacturing systems such as yield rate and throughput can be realized. In this paper, a case study has been conducted to examine the feasibility and effectiveness of the proposed method. The simulation results show that the new modeling method is able to complete the preliminary real-time quality status analysis of a manufacturing system so as to handle dynamic and stochastic manufacturing network effectively and enable decision making for process improvement. |
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