| 软X射线电离室 |
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| 引用本文： | 陈波,马玲,李福田,陈星旦.软X射线电离室[J].光学精密工程,1992,0(1):157-162. |
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| 作者姓名： | 陈波 马玲 李福田 陈星旦 |
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| 作者单位： | 应用光学国家重点实验室 |
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| 摘 要： | 软 X 射线稀有气体电离室作为软 X 射线波段绝对探测器,是通过测量光电离子流得出光谱辐射强度.并详细介绍我们研制1米软 X 射线稀有气体电离室的工作原理及结构,测出空阴极光源辐射出的HeⅡ25.6nm 离子线及 Henke 光源辐射出的 CKα 4.47nm 线的强度随电离室工作气压的变化,外推出零气压下谱线光谱辐射强度,最终得出谱线的绝对光谱辐射强度.
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Soft X-ray Ion Chamber |
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| Chen Bo,Ma Ling,Li Futian,Chen Xingden.Soft X-ray Ion Chamber[J].Optics and Precision Engineering,1992,0(1):157-162. |
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| Authors: | Chen Bo Ma Ling Li Futian Chen Xingden |
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| Affiliation: | State Key Laboratory of Applied Optics |
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| Abstract: | The technique of soft X-ray ion chamber includes the measure-ment of the ion current as a function of rare gas pressure in the ion chamber.The true photoionization current,and hence absolute photon flux,is obtained by extrapolating ion current to zero gas pressure. This paper describes measurement of the absolute photon flux at He Ⅱ25.6nm and CKα4.47nm. |
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