| CSC71018电路的可测性设计 |
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| 引用本文： | 江山. CSC71018电路的可测性设计[J]. 微电子学, 1991, 21(6): 32-39 |
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| 作者姓名： | 江山 |
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| 作者单位： | 华晶电子集团公司中央研究所(原24所分所) 无锡 |
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| 摘 要： | 本文介绍了正向设计的局用万门程控交换机专用集成电路CSC71018的可测性设计。通过可测性设计,使该电路的测试难度及测试时间减少了将近一半。
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| 关 键 词： | 程控交换机 ASIC 可测性 电路 |
Design for Testability of CSC71018 Circuit |
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| Jiang Shan. Design for Testability of CSC71018 Circuit[J]. Microelectronics, 1991, 21(6): 32-39 |
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| Authors: | Jiang Shan |
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| Abstract: | Design for testability of CSC71018, an application-specific IC for programmable switchboard with top-down design, is introduced in the paper. By design for testability,both the degree of difficulty in testing and test time are reduced nearly one half. |
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| Keywords: | Design for testability ASIC Programmable switchboard circuit |
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