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Development of fast neutron profiling method
Affiliation:1. Cyclotron and Radioisotope Center, Tohoku University, Aboba, Aramaki, Aoba-ku, Sendai 980-8578, Japan;2. Radiation Science Center, KEK, Tsukuba 305-0801, Japan;3. Graduate School, Quantum Science and Energy Engineering, Tohoku University, 980-8579, Japan
Abstract:We discuss the effects of neutron scattering and γ-ray background in fast neutron imaging and the method to reduce them. As a profiling device, a combination of an imaging plate (IP) and a polypropylene film (CH2) has been employed in this study. Good profiles were obtained by employing appropriate neutron energy, a CH2 thickness and geometry for accelerator-based fast neutrons (5–14 MeV). The neutron flux was ∼3.5×104 cm−2 s−1 in the CH2–IP position. Furthermore, we are designing the device using a position-sensitive photomultiplier in order to improve the signal-to-noise ratio by obtaining the information of pulse height for particle selection together with position.
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