首页 | 本学科首页   官方微博 | 高级检索  
     

复合负反馈技术在宽带有源微波冷噪声源中的应用
引用本文:崔 博 董 帅 王振占 王文煜. 复合负反馈技术在宽带有源微波冷噪声源中的应用[J]. 微波学报, 2024, 0(2): 30-34
作者姓名:崔 博 董 帅 王振占 王文煜
作者单位:1. 中国科学院 国家空间科学中心,北京100190; 2. 中国科学院大学 电子电气与通信工程学院,北京 100049
基金项目:国家自然科学基金(42105130)
摘    要:针对C波段宽带有源微波冷噪声源设计中输出低温噪声性能与工作带宽的矛盾,文中选用Avago公司的ATF38143型GaAs基赝掺杂高电子迁移率晶体管(pHEMT)设计了一款C波段宽带有源微波冷噪声源。采用串、并联负反馈电路拓扑结构,在保证低温噪声输出性能的同时提升了工作带宽,其中心频点为6.95 GHz,工作带宽为1.3 GHz,相对带宽为18.7%,常温条件下带内输出最低噪声温度为141.62 K,工作频段可覆盖C波段微波辐射计中心频点为6.60 GHz、6.93 GHz、7.30 GHz的三个通道。

关 键 词:有源微波冷噪声源  微波辐射计  定标  遥感  高电子迁移率晶体管

Application of Complex Negative Feedback Technology inBroadband Active Microwave Cold Noise Source
CUI Bo,DONG Shuai,WANG Zhenzhan,WANG Wenyu. Application of Complex Negative Feedback Technology inBroadband Active Microwave Cold Noise Source[J]. Journal of Microwaves, 2024, 0(2): 30-34
Authors:CUI Bo  DONG Shuai  WANG Zhenzhan  WANG Wenyu
Affiliation:1. National Space Science Center, Chinese Academy of Sciences, Beijing 100190, China; 2. School of Electronic, Electrical and Communication Engineering,University of Chinese Academy of Sciences, Beijing 100049, China
Abstract:Aiming at the contradiction between output low temperature noise performance and working bandwidth in the designof C-band broadband active microwave cold noise source, in this paper the ATF38143 GaAs-based pseudomorphic high electronmobility transistor (pHEMT) of Avago company is selected to design a C-band broadband active microwave cold noise source. Theseries and parallel negative feedback circuit topology improves the working bandwidth while ensuring the low-temperature noise outputperformance. Its center frequency is 6.95 GHz, the working bandwidth is 1.3 GHz, and the relative bandwidth is 18.7%. Itslowest in-band output noise temperature is 141. 62 K under the normal temperature conditions, and the working frequency band cancover the three channels of the C-band microwave radiometer center frequency points of 6.60 GHz, 6.93 GHz, and 7.30 GHz.
Keywords:active microwave cold noise source   microwave radiometer   calibration   remote sensing   high electron mobility transistor
点击此处可从《微波学报》浏览原始摘要信息
点击此处可从《微波学报》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号