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垂直堆垛InAs量子点材料的分子束外延生长
引用本文:李树玮,小池一步,矢野满明.垂直堆垛InAs量子点材料的分子束外延生长[J].稀有金属,2004,28(1):207-209.
作者姓名:李树玮  小池一步  矢野满明
作者单位:1. 中山大学光电材料与技术国家重点实验室,广东,广州,510275
2. 大阪工业大学新材料研究中心,大阪,535-8585,日本
摘    要:用MBF设备以Stranski-Krastanov生长方式外延生长了5个周期垂直堆垛的InAs量子点,在生长过程中使用对形状尺寸控制法来提高垂直堆垛InAs量子点质量和均匀性。样品外延的主要结构是500nm的GaAs外延层,15nm的Al0.5Ga0.5As势垒外延层,5个周期堆跺的InAs量子点,50nm的Al0.5Ga0.5Asnm势垒外延层等。在生长过程中用反射式高能电子衍射仪(RHEED)实时监控。生长后用原子力显微镜(AFM)进行表面形貌的表征,再利用光制发光(PL)对InAs量子点进行观测。

关 键 词:晶体生长  垂直堆垛的InAs量子点  分子束外延(MBE)  光致发光
文章编号:0258-7076(2004)01-0207-03

Growth of Vertically Stacked and Self-Assembled InAs Quantum Dots
Li Shuwei ,Koike Kazuto ,Yano Mitsuaki.Growth of Vertically Stacked and Self-Assembled InAs Quantum Dots[J].Chinese Journal of Rare Metals,2004,28(1):207-209.
Authors:Li Shuwei  Koike Kazuto  Yano Mitsuaki
Affiliation:Li Shuwei 1*,Koike Kazuto 2,Yano Mitsuaki 2
Abstract:The epilayer of vertically stacked, self assembled InAs Quantum Dots (QDs) was grown by molecular beam epitaxy (MBE) in Stranski Krastanov growth mode with solid sources in non cracking K cells. The surface morphologies were measured by reflection high energy electron diffraction (RHEED) and atomic force microscopy (AFM). To improve the morphology, a size and density controlled growth procedure for the vertically stacked InAs QDs was employed. The 5 period vertically stacked InAs QDs in the barrier layer of a field effect type structure were measured by photoluminescence property.
Keywords:crystal growth  vertically stacked and self  assembled quantum dots  molecular beam epitaxy  photoluminescence property
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