| JEM-1200EX型电镜SENSITIVITY值
与电子照射密度之间关系的测量分析 |
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| 引用本文： | 朱永哲,金英锦,文香兰,李,英,姜重建,金奎龙.JEM-1200EX型电镜SENSITIVITY值
与电子照射密度之间关系的测量分析[J].电子显微学报 |
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| 作者姓名： | 朱永哲 金英锦 文香兰 李 英 姜重建 金奎龙 |
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| 摘 要： |
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| 文章编号： | 1000-6281(1999)05-0562-0566 |
Measurement and analysis
of the relationship between
sensitivity value and the charge density by electronic
irradiation on film of JEM-1200EX type
electron microscope |
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| ZHU Yong-zhe JIN Ying-jin WEN,Xiang-lan LI Ying JIANG Zhong-jian JIN Kui-long.Measurement and analysis
of the relationship between
sensitivity value and the charge density by electronic
irradiation on film of JEM-1200EX type
electron microscope[J].Journal of Chinese Electron Microscopy Society |
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| Authors: | ZHU Yong-zhe JIN Ying-jin WEN Xiang-lan LI Ying JIANG Zhong-jian JIN Kui-long |
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