| JEM-1200EX型电镜SENSITIVITY值与电子照射密度之间关系的测量分析 |
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| 引用本文： | 朱永哲 金英锦 文香兰 李 英 姜重建 金奎龙. JEM-1200EX型电镜SENSITIVITY值与电子照射密度之间关系的测量分析[J]. 电子显微学报, 1999, 1: 2 |
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| 作者姓名： | 朱永哲 金英锦 文香兰 李 英 姜重建 金奎龙 |
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| 摘 要： |
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| 文章编号： | 1000-6281(1999)05-0562-0566 |
Measurement and analysisof the relationship betweensensitivity value and the charge density by electronicirradiation on film of JEM-1200EX typeelectron microscope |
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| ZHU Yong-zhe JIN Ying-jin WENXiang-lan LI Ying JIANG Zhong-jian JIN Kui-long. Measurement and analysisof the relationship betweensensitivity value and the charge density by electronicirradiation on film of JEM-1200EX typeelectron microscope[J]. Journal of Chinese Electron Microscopy Society, 1999, 1: 2 |
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| Authors: | ZHU Yong-zhe JIN Ying-jin WENXiang-lan LI Ying JIANG Zhong-jian JIN Kui-long |
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