Properties of porous silicon-nitride materials |
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Authors: | V. N. Antsiferov V. G. Gilev |
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Affiliation: | (1) Perm Polytechnical Institute, USSR |
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Abstract: | Conclusions Newly developed porous silicon-nitride materials from elements have a thin walled porous structure, which in comparison with known materials for the same kind and similar porosity have a lower thermal conductivity, high strength, deformability, and thermal-shock resistance as well as satisfactory resistance to oxidation at temperatures of about 800°C.Translated from Ogneupory, No. 7, pp. 20–23, July, 1988. |
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