俄歇参数法及其在硅酸盐材料研究中的应用

本文对Auger参数法及其在硅酸盐材料研究中的应用作了综合介绍。在VG ESCALAB MKII电子能谱仪上作了韧致辐射激发Si KLL的尝试。实验结果表明,普通配有Al/Mg双阳极的X射线光电子能谱仪可以获得SiKLL线;用Auger参数法可弥补XPS法在硅酸盐材料分析方面的不足,并为AP法在该材料领域中的应用指出了乐观的前景。

AUGER PARAMETER AND ITS APPLICATION IN SILICATE MATERIALS

The paper gives a comprehensive introduction to Auger parameter and its applications in silicate materials study. Experiments on SiKLL lines emitted by bremsstrahlung radiation from Al/Mg X-ray sources with Al window were made. All experimental data show that SiKLL lines is easily observed by means of a new ESCALAB MKII spectrometer with Al/Mg X-ray sources and Al window. The analysis of Auger parameter is a very good complementary method for XPS study of silicate materials and its applications to silicate materials will have a very good future.