| 扫描设计中测试逻辑的研究 |
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| 引用本文： | 肖忠辉,邵寅亮,王磊,商松.扫描设计中测试逻辑的研究[J].微电子技术,1998(3). |
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| 作者姓名： | 肖忠辉 邵寅亮 王磊 商松 |
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| 作者单位： | 北京科技大学计算机系!北京，100083，北京中庆微数字设备有限公司!北京，10O086 |
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| 摘 要： | 本文首先分析了时序元件的不可测因素，介绍了扫描设计前增加测试逻辑的设计方法。实践证明，该方法简便易行，故障覆盖率高达99％。
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| 关 键 词： | 扫描设计 可测性 测试生成 |
Research on Test Logic Insertion of Scan Design |
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| Xiao Zhonghui, Shao Yanliang, Wang Lei and Shang Song.Research on Test Logic Insertion of Scan Design[J].Microelectronic Technology,1998(3). |
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| Authors: | Xiao Zhonghui Shao Yanliang Wang Lei and Shang Song |
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| Abstract: | This paper, based on analysis of the untested factors of the sequence cell. presents a design mehtod. in which the test logic is inserted before the scan design. In practice, the method is very simple and convenient. The result fault coverage is highly 99%. |
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| Keywords: | Scan desing testability test generation |
| 本文献已被 CNKI 等数据库收录！ |
