| 纳米TiO_2薄膜的制备及其光谱特性研究 |
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| 引用本文： | 郝丽媛,周炳卿,韩兵,陈霞,李力猛,那日苏,王丽娟. 纳米TiO_2薄膜的制备及其光谱特性研究[J]. 信息记录材料, 2009, 10(5): 17-22 |
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| 作者姓名： | 郝丽媛 周炳卿 韩兵 陈霞 李力猛 那日苏 王丽娟 |
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| 作者单位： | 内蒙古师范大学,物理与电子信息学院,功能材料物理与化学自治区重点实验室,呼和浩特,010022 |
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| 摘 要： | 采用溶胶凝胶法和旋转涂膜工艺,以普通玻璃为衬底,制备均匀、透明的TiO2纳米薄膜。利用X射线衍射仪(XRD)、原子力显微镜(AFM)和紫外可见光谱(UV/vis)对TiO2进行表征。通过500℃、600℃、700℃、800℃和900℃恒温烧结2h后XRD测试表明:经500°C退火得到TiO2粉末为锐钛矿晶相,800℃转化为金红石相结构,900℃出现了金红石相与板钛矿相的混合晶相。通过AFM观测,薄膜的平均粗糙度为1.71nm。通过紫外可见光谱分析,探讨了影响TiO2纳米膜厚度和禁带宽度度的各种因素。结果表明:涂膜次数、热处理温度等将直接影响二氧化钛薄膜的紫外可见光谱和禁带宽度。
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| 关 键 词： | TiO2纳米膜 溶胶凝胶法 XRD 紫外可见光谱 |
Preparation of Nanocrystalline TiO_2 Thin Film and Study of Its Spectral Ability |
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| HAO Li-yuan,ZHOU Bing-qing,CHEN Xia,HAN Bing,LI Li-meng,NA Ri-su,WANG Li-juan. Preparation of Nanocrystalline TiO_2 Thin Film and Study of Its Spectral Ability[J]. Information Recording Materials, 2009, 10(5): 17-22 |
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| Authors: | HAO Li-yuan ZHOU Bing-qing CHEN Xia HAN Bing LI Li-meng NA Ri-su WANG Li-juan |
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| Affiliation: | HAO Li-yuan,ZHOU Bing-qing,CHEN Xia,HAN Bing,LI Li-meng,NA Ri-su,WANG Li-juan(College of Physics , Electron Information of Inner Mongolia Normal University Key Lab of Physics , Chemistry for Functional Material,Huhhot 010022,China) |
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| Abstract: | The uniform transparent nanocrystalline TiO2 thin films were prepared on glass substrate by sol-gel method. The nanostructure TiO2 were characterized by XRD,AFM and UV-VIS spectra. The Structure of TiO2 powders was investigated by X-ray diffraction after heating treatment in 500°C、600℃、700℃、800℃ and 900℃. The results show that the crystalline phase is anatase in 500°C 、rutile in 800℃ and the composite phase structure of rutile and Brookit in 900℃. the films roughness average is 1.71 nm by AFM.The thickness and the bandgap of nanocrystalline TiO2 thin films were calculated by using the UV-Vis spectra.The results show that aging time,heat treatment and dip coating times would affect the UV-Vis spectra and the bandgap of TiO2 thin films. |
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| Keywords: | XRD |
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