| 基于Bose-Lin码的组合电路容错设计 |
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| 引用本文： | 李明,肖桂军,韩彤辉. 基于Bose-Lin码的组合电路容错设计[J]. 微电子学与计算机, 2007, 24(7): 190-193 |
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| 作者姓名： | 李明 肖桂军 韩彤辉 |
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| 作者单位： | 上海大学,微电子研究与开发中心,上海,200072 |
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| 摘 要： | 应用Bose-Lin码实现了特定功能的组合电路容错设计，并采取在输入输出端加入缓存的方法，当电路出现故障时可以使系统恢复正常工作。为了方便电路的扩展，还进一步优化了输入输出端缓存的结构。
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| 关 键 词： | 全自检(TSC) t个单向错误检测(t-UED) 偶发性单向错误检测(BUED) 双轨检测器 |
| 文章编号： | 1000-7180（2007）07-0190-04 |
| 修稿时间： | 2006-07-30 |
A Fault-Tolerant Design of Combinational Circuit Based on Bose-Lin Codes |
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| LI Ming,XIAO Gui-jun,HAN Tong-hui. A Fault-Tolerant Design of Combinational Circuit Based on Bose-Lin Codes[J]. Microelectronics & Computer, 2007, 24(7): 190-193 |
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| Authors: | LI Ming XIAO Gui-jun HAN Tong-hui |
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| Affiliation: | Microelectronic Research and Development Center, Shanghai University, Shanghai 200072, China |
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| Abstract: | This paper presents a fault-tolerant design of combinational circuits with simple function for Bose-Lin Codes. The error correcting function is implemented by adding two extra buffers to input and output ports to recover the system when an error occurs. Moreover, the architecture of these buffers needs to be optimized and unified to facilitate the extension of such circuits. |
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| Keywords: | totally self-checking t-unidirectional error detecting burst unidirectional error detecting two-rail checker |
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