Thermally stimulated current measurements in N-type LEC GaP |
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Authors: | E Fabre R N Bhargava W K Zwicker |
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Affiliation: | (1) Philips Laboratories, 10510 Briarcliff Manor, N. Y.;(2) Present address: L.E.P., 94450 Limeil-Brevannes, France |
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Abstract: | Thermally stimulated current measurements have “been performed on n-type LEC GaP substrates. Nine deep donor states with energy
level ranging from 0.27eV to 0.90eV have been observed. The most prominent peak at O.36eV has been associated with the incorporation
of common donors Te, Se and S and it is found that the concentration of this 0.36eV trap increases as the square of the net
doping concentration (ND-NA). Association of this O.36eV trap with the commonly observed 1.72eV luminescence band and the S-pits in LEC crystals is discussed. |
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Keywords: | thermal detrapping deep state spectroscopy nonradiative centers gallium phosphide |
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