| 非同轴微波器件测试夹具的设计与应用 |
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| 引用本文： | 雷静. 非同轴微波器件测试夹具的设计与应用[J]. 电子元件与材料, 2011, 30(7): 60-63 |
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| 作者姓名： | 雷静 |
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| 作者单位： | 中国西南电子技术研究所,四川成都,610036 |
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| 摘 要： | 由于非同轴微波器件接口的特殊性，无法直接与同轴接口的矢量网络分析仪相连进行测试，非同轴器件的微波性能测试面临较大的困难，目前，国内非同轴器件的测试技术已严重滞后其设计开发工作。对非同轴微波器件接口进行了深入研究，设计了针对非同轴微波器件测试的分体式夹具，解决了去嵌入技术问题，并以实例验证了该测试装置的正确性。大量测试表...
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| 关 键 词： | 非同轴微波器件 测试 夹具 去嵌入技术 |
Design and application of test-fixture for non-coaxial microwave device |
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| LEI Jing. Design and application of test-fixture for non-coaxial microwave device[J]. Electronic Components & Materials, 2011, 30(7): 60-63 |
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| Authors: | LEI Jing |
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| Affiliation: | LEI Jing(Southwest China Institute of Electronic Technology,Chengdu 610036,China) |
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| Abstract: | Non-coaxial microwave devices could not connect directly to the coaxial vector network analyzer due to its special properties;it was difficult to test the performance of non-coaxial microwave devices.Nowadays,the domestic non-coaxial microwave devices test technology lagged far behind its research and development works.The ports of non-coaxial microwave devices were studied,the split-type test fixtures for non-coaxial microwave devices were designed and the problem of de-embedding technique was solved.Final... |
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| Keywords: | non-coaxial microwave device test fixture de-embedding technique |
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