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X-Ray Diffraction Study of Ba6-3x (Eu1/2 Nd1/2)8+2x Ti18O54 Microwave Dielectric Ceramics Prepared by Sol-Gel Method
Affiliation:1. School of Materials Science and Engineering, China Jiliang University, Hangzhou 310018, China;2. State Key Laboratory of Crystal Materials, School of Physics and Microelectronics, Shandong University, Jinan 250100, China
Abstract:Perfectly-sintered Ba6-3x (Eu1/2 Nd1/2)8+2x Ti18O54 (x = 2/3) (BENT) microwave dielectric ceramics was fabricated successfully with BENT powders prepared by Sol-Gel process. The lattice parameters of BENT ceramic powders were determined by method of X-ray diffraction in ordinary temperature. Orthorhombic lattice type (space group Pbam) of BENT in ordinary temperature was determined, its pattern was indexed and its polycrystalline X-ray diffraction data were listed. By analysis of its X-ray diffraction data, it could be concluded that Eu and Nd coexisted in the single phase and could not be distinguished in BENT ceramics. The increasing dielectric losses of BENT could be explained basically by the disorder of Eu ions and Nd ions occupied in Al-sites.
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