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Direct observation of CD4 T cell morphologies and their cross-sectional traction force derivation on quartz nanopillar substrates using focused ion beam technique
Authors:Dong-Joo Kim  Gil-Sung Kim  Jung-Hwan Hyung  Won-Yong Lee  Chang-Hee Hong  Sang-Kwon Lee
Affiliation:1.Basic Research Laboratory (BRL), Department of Semiconductor Science and Technology, Chonbuk National University, Jeonju 561-756, Republic of Korea;2.Department of Physics, Chung-Ang University, Seoul 156-756, Republic of Korea
Abstract:Direct observations of the primary mouse CD4 T cell morphologies, e.g., cell adhesion and cell spreading by culturing CD4 T cells in a short period of incubation (e.g., 20 min) on streptavidin-functionalized quartz nanopillar arrays (QNPA) using a high-content scanning electron microscopy method were reported. Furthermore, we first demonstrated cross-sectional cell traction force distribution of surface-bound CD4 T cells on QNPA substrates by culturing the cells on top of the QNPA and further analysis in deflection of underlying QNPA via focused ion beam-assisted technique.
Keywords:Cell traction force   Cell adhesion   CD4 T cell   Cell migration   Focused ion beam
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