Critical current density and microstructure of YBa2Cu3O7 thin films post-annealed at a low oxygen partial pressure |
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Authors: | A. Mogro-Campero L. G. Turner E. L. Hall |
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Affiliation: | (1) GE Research and Development Center, 12301 Schenectady, New York |
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Abstract: | Post-annealing of thin films of YBa2Cu3O7 (YBCO) has been performed at 29 Pa and 750°C. For films 0.6 m thick, a critical current density >1 MA cm–2 is obtained at 77 K, with a sharp eddy current response at 25 MHz. Microstructural investigation of these films by crosssectional and planar transmission electron microscopy reveals that the YBCO film has thec-axis normal to the plane of the substrate in a continuous sheet of varying thickness, frequently covering the entire thickness of the film. Mutually perpendicular rods with thec-axis in the plane of the LaAlO3 substrate are also seen. The microstructure and critical current density of these films are compared with those of previously reported films post-annealed in atmosphericpressure oxygen. |
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Keywords: | Superconducting films YBa2Cu3O7 critical current density microstructure |
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