Transient power supply current monitoring—A new test method for CMOS VLSI circuits |
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Authors: | Shyang-Tai Su Rafic Z Makki Troy Nagle |
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Affiliation: | (1) Hewlett Packard, 80525 Fort Collins, Colorado;(2) University of North Carolina at Charlotte, 28223 Charlotte, NC;(3) North Carolina State University, 27695 Raleigh, NC |
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Abstract: | We present a new method for testing digital CMOS integrated circuits. The new method is based on the following premise: monitor the switching behavior of a circuit as opposed to the output logic state. We use the transient power supply current as a window of observability into the circuit switching behavior. A method for isolating normal switching transients from those which result from defects is introduced. The feasibility of this new testing approach is investigated by conducting several experiments involving the design of integrated circuits with built-in defects, fabrication, and physical testing. The results of these experiments show this new test method to be a promising one for detecting defects that can escape stuck-at testing andI
DDQ
testing. |
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Keywords: | Design for current-testability drain/source opens floating gates shorts transient power supply current |
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