Testable switched-capacitor filters |
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Authors: | Huertas JL Rueda A Vazquez D |
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Affiliation: | Dept. Diseno Analogico, Sevilla Univ.; |
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Abstract: | A design-for-testability (DFT) methodology for switched-capacitor (SC) filters is presented, based on an architecture using some additional circuitry and providing extra capabilities for both off- and online test. A programmable biquad is used for on-chip comparison of the transfer functions for every filter stage. Test area overhead consists of the programmable biquad, a set of switches, and a finite-sequential-machine (FSM) control part. The design and implementation of an example filter are included to assess the potential usefulness of this approach |
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