| 原子力显微镜发展近况及其应用 |
| |
| 引用本文： | 张德添,何昆,张飒,杨怡,周涛,张学敏,赵晓光,薛燕.原子力显微镜发展近况及其应用[J].现代仪器,2002,8(3):6-9. |
| |
| 作者姓名： | 张德添 何昆 张飒 杨怡 周涛 张学敏 赵晓光 薛燕 |
| |
| 作者单位： | 军事医学科学院国家生物医学分析中心,北京,100850 |
| |
| 摘 要： | 扫描隧道显微镜(简称STM)和原子力显微镜(简称AFM),它们也可统称为扫描探针显微镜(简称SPM)。原子力显微镜(AFM) 是近十几年来表面成像技术中最重要的进展之一。与扫描电子显微镜相比,它具有较高的分辨率。本文将讨论原子力显微镜的工作原理、原子力显微镜的发展概况和应用。
|
| 关 键 词： | 原子力显微镜 分辨率 |
The development for atomic force microscopy recently and the brief introduction of application |
| |
| Zhang Detian He Kun Zhang Sa Yang yi Zhou Tao Zhang Xuemin Zhao Xiaoguang Xue Yan.The development for atomic force microscopy recently and the brief introduction of application[J].Modern Instruments,2002,8(3):6-9. |
| |
| Authors: | Zhang Detian He Kun Zhang Sa Yang yi Zhou Tao Zhang Xuemin Zhao Xiaoguang Xue Yan |
| |
| Affiliation: | National Center of Biomedical Analysis Beijing 100850 |
| |
| Abstract: | Hie Scanning Tunneling Microscopy (SIM) and Atomic Force Microscopy (AFM) can be called by a joint name the Scanning Probe Microscopy (SPM) . AFM is the foremost development on the image technique of the surface in near ten years. AFM be provided with higher resolution than the scanning electron microscopy. In the paper, the working principle of AFM, the development general situation and the application introduce for AFM will be discussed. |
| |
| Keywords: | Atomic Force Microscopy Resolution |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
