Shear force control for a terahertz near field microscope |
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| Authors: | Buersgens F Acuna G Lang C H Potrebic S I Manus S Kersting R |
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| Affiliation: | Photonics and Optoelectronics Group, University of Munich, Amalienstr. 54, 80799 Munich, Germany. |
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| Abstract: | We report on the advancement of apertureless terahertz microscopy by active shear force control of the scanning probe. Extreme subwavelength spatial resolution and a maximized image contrast are achieved by maintaining a tip-surface distance of about 20 nm. The constant distance between scanning tip and surface results in terahertz images that mirror the dielectric permittivity of the surface. |
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