| 一种新型光电设备响应时间与探测概率自动测试系统 |
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| 引用本文： | 时成文,隋强强,石碧艳. 一种新型光电设备响应时间与探测概率自动测试系统[J]. 光电技术应用, 2008, 23(1): 38-41 |
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| 作者姓名： | 时成文 隋强强 石碧艳 |
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| 作者单位： | 1. 东北电子技术研究所,辽宁,锦州,121000
2. 北京航空航天大学,北京,100083 |
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| 摘 要： | 提出了一种实用新型光电设备系统响应时间及探测概率自动测试系统.该系统采用闭环控制原理,以TMS320LF2407DSP为核心,通过可控模拟目标源、双余度反馈,保证了测试结果的可靠性及准确性.大量的测试试验验证了该方法的有效性.
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| 关 键 词： | 闭环控制 TMS320LF2407 可变光阑 响应时间 探测概率 |
| 文章编号： | 1673-1255(2008)01-0038-04 |
| 修稿时间： | 2008-01-30 |
A New Automatic Test System of Reaction Time and Detection Probability for Electro-optic Equipments |
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| SHI Cheng-wen,SUI Qiang-qiang,SHI Bi-yan. A New Automatic Test System of Reaction Time and Detection Probability for Electro-optic Equipments[J]. Electro-Optic Technology Application, 2008, 23(1): 38-41 |
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| Authors: | SHI Cheng-wen SUI Qiang-qiang SHI Bi-yan |
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| Affiliation: | SHI Cheng-wen, SUI Qiang-qiang, SHI Bi-yan (1, Northeast Research Institute of Electronics Technology, Jinzhou , 121000, China ; 2. Beijing University of Aeronautics and Astronautics, Beijing , 100083, China ) |
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| Abstract: | A practical new automatic test system of reaction time and detection probability for electro-optic equipments is put forward. By using closed-loop control theory and taking the TMS320LF2407 DSP as the heart, the system can guarantee the reliability and the accuracy of the tests based on the controllable simulated targets sources and the feedback of double-loop. The tests have shown the effectiveness of such system. |
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| Keywords: | closed-loop control TMS320LF2407 DSP variable diaphragm reaction time detection probability |
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