A novel simultaneous unipolar multispectral integrated technology approach for HgCdTe IR detectors and focal plane arrays |
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| Authors: | W. E. Tennant M. Thomas L. J. Kozlowski W. V. McLevige D. D. Edwall M. Zandian K. Spariosu G. Hildebrand V. Gil P. Ely M. Muzilla A. Stoltz J. H. Dinan |
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| Affiliation: | (1) Rockwell Science Center, 1049 Camino Dos Rios, 91360 Thousand Oaks, CA;(2) Boeing Electronic Systems and Missile Defense, 92803 Anaheim, CA;(3) E-OIR Measurements, Inc., 22553 Spotsylvania, VA;(4) Night Vision & Electronic Sensors Directorate (NVESD), 22060-5806 Fort Belvoir, VA |
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| Abstract: | In the last few years Rockwell has developed a novel simultaneous unipolar multispectral integrated HgCdTe detector and focal plane array technology that is a natural and relatively straightforward derivative of our baseline double layer planar heterostructure (DLPH) molecular beam epitaxial (MBE) technology. Recently this technology was awarded a U.S. patent. This simultaneous unipolar multispectral integrated technology (SUMIT) shares the high performance characteristics of its DLPH antecedent. Two color focal plane arrays with low-1013 cm−2s−1 background limited detectivity performance (BLIP D*) have been obtained for mid-wave infrared (MWIR, 3–5 m) devices at T>130 K and for long-wave infrared (LWIR, 8–10 m) devices at T∼80 K. |
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| Keywords: | HgCdTe MBE MWIR LWIR |
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