Scanning near-field optical microscopy signal processing and resolution |
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Authors: | Grosges Thomas Barchiesi Dominique |
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Affiliation: | Laboratoire de Nanotechonologie et d'Instrumentation Optique, Institut Charles Delaunay, Université de Technologie de Troyes, Troyes Cedex, France. thomas.grosgges@utt.fr |
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Abstract: | To increase the signal-to-noise ratio and to remove the spatially slow varying signals, a lock-in amplifier is often used in scanning probe microscopy. The signal reconstructed from the lock-in data contains the contributions of the evanescent and homogeneous waves that are mixed in the near-field zone (i.e., at a very short distance). The resolution is determined and a method is given to suppress the useless background information. Experimental images of nanoparticles are processed. |
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