Structural and optical properties of sulfur-annealed CuInS2 thin films |
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| Authors: | M Abaab M Kanzari B Rezig M Brunel |
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| Affiliation: | a Laboratoire de Photovoltaïque et Matériaux Semiconducteurs-ENIT BP 37, Le Belvédère 1002- Tunis, Tunisia;b Laboratoire de Cristallographie, 25 Avenue des Martyrs, 166X, 38042 Grenoble, France |
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| Abstract: | CuInS2 thin films were deposited by single source vacuum thermal evaporation method on substrates submitted to longitudinal thermal gradient. Some of these films were annealed in sulfur atmosphere and converted into CuInS2 homogenous layers. Both of the as-deposited and sulfurated films were characterized by X-ray diffraction, optical transmission and reflection measurements. The optical band gap of films after sulfurization was 1.50 eV which is near the optimum value for photovoltaic energy conversion. |
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| Keywords: | CuInS2 thin films X-ray diffraction Vacuum thermal evaporation |
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