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In Operando Monitoring by Analysis of Backscattered Electrons during Electron Beam Melting |
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| Authors: | Christopher Arnold,Jonas B hm,Carolin K rner |
| Affiliation: | Christopher Arnold,Jonas Böhm,Carolin Körner |
| Abstract: | |
| Keywords: | additive manufacturing backscattered electrons electron beam melting in-process monitoring in situ measurements quality control |