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X-ray imaging with “edge-on” microchannel plate detector: first experimental results |
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| Authors: | Polad M Shikhaliev Sabee Molloi |
| Affiliation: | Department of Radiological Sciences, Imaging Physics Laboratory, University of California, Medical Sciences I, B-140, Irvine, CA 92697, USA |
| Abstract: | A novel scanning slit X-ray imaging system based on an “edge-on” microchannel plate detector was developed and tested. Images were acquired at 50 kV(p) X-ray tube voltage with a limiting spatial resolution of 7 lp/mm. The pixel noise was measured to be 0.3 count/pixel/s for a 50×70 μm2 pixel size. This photon counting detector can be considered to be virtually noise free. |
| Keywords: | X-ray imaging MCP detector “Edge-on” method Scanning slit |
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