Investigation on the layout strategy of gg NMOS ESD protection devices for uniform conduction behavior and optimal width scaling |
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Affiliation: | LU GuangYi;WANG Yuan;ZHANG LiZhong;CAO Jian;JIA Song;ZHANG Xing;Institute of Microelectronics, Peking University;Innovation Center for Micro/Nanoelectronics and Integrated System; |
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