| 不同厚度的La2/3Sr1/3MnO3多晶薄膜输运性质研究 |
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| 引用本文： | 蒋晓龙,徐庆宇,桑海,都有为.不同厚度的La2/3Sr1/3MnO3多晶薄膜输运性质研究[J].功能材料,2003,34(2):231-231,233. |
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| 作者姓名： | 蒋晓龙 徐庆宇 桑海 都有为 |
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| 作者单位： | 南京大学,固体微结构物理实验室,江苏,南京,210093 |
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| 基金项目： | 国家重点基础研究发展计划(973计划)，国家自然科学基金，G1999064508，19890310(4，， |
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| 摘 要： | 运用磁控溅射的方法,在表面氧化的Si(100)基片上制备了一系列不同厚度的La2/3Sri/3MnO3多晶薄膜.根据对输运的研究,发现存在一个厚度73nm,当t＞73nm的时候,薄膜呈现出与块材类似的输运特点,而当t＜73nm的时候,薄膜的电阻太大以至于薄膜的金属-绝缘体转变温度(Tp)变得不可测量.X射线衍射(XRD)结果显示:在t=73nm附近存在一个结构的转变.这表明La2/3Sr1/3MnO3不同厚度多晶薄膜的输运性质的不同或许来自结构的转变.
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| 关 键 词： | La2／3Sr1／3MnO3多晶薄膜 输运性质 磁控溅射 厚度 结构 |
| 文章编号： | 1001-9731(2003)02-0231-01 |
Thickness-dependent transport properties of La2/3Sr1/3MnO3 polycrystalline films |
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| JIANG Xiao-long,XU Qing-yu,SANG Hai,DU You-wei.Thickness-dependent transport properties of La2/3Sr1/3MnO3 polycrystalline films[J].Journal of Functional Materials,2003,34(2):231-231,233. |
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| Authors: | JIANG Xiao-long XU Qing-yu SANG Hai DU You-wei |
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| Abstract: | A series of La2/3Sr1/3MnO3 polycrystalline films with various thickness t were prepared on Si(100) substrate with oxidized surface using magnetron sputtering technique. A critical thickness of about 73nm was observed upon their transport properties. As t >73nmt the films show the bulk-like transport properties. While as t<73nm, the resistance of the films was too large and the metal-insulator transition temperature (Tp) becomes unmeasurable. The results of X-ray diffraction (XRD) show a structure phase transition taking place around t = 73nm. It suggests that the phase transition may account for the thickness-dependent transport properties of La2/3 Sr1/3 MnO3 polycrystalline films. |
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| Keywords: | La2 sSiY/sMnOa films transport properties |
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