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An Unusual Mechanism of Misfit Stress Relaxation in Thin Nanofilms |
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| Authors: | Trukhanov E M Teys S A |
| Affiliation: | 1.Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences, 630090, Novosibirsk, Russia ; |
| Abstract: | Technical Physics Letters - A new mechanism of misfit stress relaxation in nanofilms with variable density of surface phases is established. This phenomenon is ensured by ordered mass transfer of... |
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