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Dependence of Al2O3 coating thickness and annealing conditions on microstructural and electrochemical properties of LiCoO2 film
Authors:Sun-Gyu Park  Seong-Rae Lee  Won Il Cho  Byung Won Cho
Affiliation:(1) School of Materials Science and Engineering, University of New South Wales, Sydney, NSW, 2052, Australia;(2) Department of Materials Science and Engineering, National Taiwan University, Taipei, 106, Taiwan;(3) Department of Information Materials Science and Engineering, Guilin University of Electronic Technology, Guilin, 541004, China
Abstract:We studied the dependence of Al2O3 coating thickness and annealing conditions on the surface morphology and electrochemical properties of Al2O3 coated LiCoO2 films. The optimum coating thickness allowing for the highest capacity retention was about 24 nm. A sample consisting of Al2O3 coated on annealed LiCoO2 film with additional annealing at 400 °C had a uniform coating layer between the coating materials and cathode films. This sample showed the best capacity retention of ∼91 % with a charge-cut off of 4.5 V after 30 cycles, while the bare cathode film showed a capacity retention of ∼32 % under the same conditions. The formation of second phases such as Co-Al-O was observed in the coating films by X-ray photoelectron spectroscopy (XPS). The Co-Al-O containing samples showed a higher initial capacity because of their smaller grain size, but less capacity retention than the Al2O3 containing samples.
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