| 国外EEPROM器件的可靠性增长与考核技术 |
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| 引用本文： | 于宗光 何晓娃. 国外EEPROM器件的可靠性增长与考核技术[J]. 电子产品可靠性与环境试验, 2000, 0(4): 38-44 |
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| 作者姓名： | 于宗光 何晓娃 |
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| 作者单位： | 信息产业部无锡微电子科研中心!江苏无锡214035 |
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| 摘 要： | 分析了提高ＥＥＰＲＯＭ器件耐久性和保持特性的途径，提出了寿命预测的方法和保持特性的考核标准。
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| 关 键 词： | 电可擦可编程序只读存储器 耐久性 保持特性 |
Review on Reliability Growth and its Assessment for EEPROM Abroad |
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| YU Zong-guang,HE Xiao-wa. Review on Reliability Growth and its Assessment for EEPROM Abroad[J]. Electronic Product Reliability and Environmental Testing, 2000, 0(4): 38-44 |
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| Authors: | YU Zong-guang HE Xiao-wa |
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| Abstract: | The approach to improve durability and retentivity of EEPROM was analyzed.The lifetime pre- diction method and the assessment creteria for retentivity were presented |
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| Keywords: | EEPROM durability retentivity |
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