Effects of Ce Addition on the Microstructure and Mechanical Properties of Sn-58Bi Solder Joints |
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Authors: | Tung-Han Chuang Hsing-Fei Wu |
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Affiliation: | (1) Department of Materials Science and Engineering, National Taiwan University, 1 Roosevelt Road, Sec. 4, Taipei, 106, Taiwan |
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Abstract: | The effects of a rare-earth element on the microstructure, mechanical properties, and whisker growth of Sn-58Bi alloys and
solder joints in ball grid array (BGA) packages with Ag/Cu pads have been investigated. Mechanical testing indicated that
the elongation of Sn-58Bi alloys doped with Ce increased significantly, and the tensile strength decreased slightly, in compar- ison
with undoped Sn-58Bi. In addition, the growth of both fiber- and hillock-shaped tin whiskers on the surface of Sn-58Bi-0.5Ce
was retarded in the case of Sn-3Ag-0.5Cu-0.5Ce alloys. The growth of interfacial intermetallic compounds (IMC) in Sn-58Bi-0.5Ce
solder joints was slower than that in Sn-58Bi because the activity of Ce atoms at the interface of the Cu6Sn5 IMC/solder was reduced. The reflowed Sn-58Bi and Sn-58Bi-0.5Ce BGA packages with Ag/Cu pads had a ball shear strength of
7.91 N and 7.64 N, which decreased to about 7.13 N and 6.87 N after aging at 100°C for 1000 h, respectively. The reflowed
and aged solder joints fractured across the solder balls with ductile characteristics after ball shear tests. |
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