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BGA焊点气孔缺陷的特殊结构光质量检测
引用本文:袁肇飞,曹其新,杨扬.BGA焊点气孔缺陷的特殊结构光质量检测[J].微型电脑应用,2008,24(10):32-33.
作者姓名:袁肇飞  曹其新  杨扬
作者单位:上海交通大学机器人研究所,上海,200240
基金项目:特别感谢欧姆龙(Omron)公司提供资料图片.
摘    要:为了解决球栅阵列(BGA)焊点气孔缺陷的在线检测问题,开发了一种特殊的结构光检测技术。同时用环形红光和十字形绿光发射二极管(LED)照明BGA芯片,通过环形和十字形的中心,布置一个带有远心透镜的电荷耦合器(CCD)摄像机记录小球上红色圆环和绿色十字的图像。根据图像半径方向上的纹理频谱分布特征,引入人工神经网络(ANN)算法对BGA芯片的气孔缺陷进行检测。采用真实的BGA焊点进行实验,结果验证了方法的精度和可行性。

关 键 词:球栅阵列(BGA)  焊点  气孔  反光表面  检测

Structured Light Projection Technique for BGA Void Inspection
Yuan Zhao-fei,CAO Qi-xin,YANG Yang.Structured Light Projection Technique for BGA Void Inspection[J].Microcomputer Applications,2008,24(10):32-33.
Authors:Yuan Zhao-fei  CAO Qi-xin  YANG Yang
Abstract:A novel structural light technique was developed for ball grid array (BGA) void on-line inspection.A light emitting diode (LED) ring light and a LED cross light were used to illuminate the BGA package with a charge-coupled device (CCD) to capture the image through the center hole of the ring light and the cross light.By extracting the spectral energy distribution features as a function of radius from the center of the spectrum using artificial neural network (ANN),we evaluated these techniques using actual BGA bumps.As a result,the correct rate of judgment reached 96.9%.which clearly showed that our method could be useful in the practice.
Keywords:Ball grid array (BGA)  Bump  Void  Specular surface  Inspection
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