| 采用F-P干涉腔的高分辨率半导体激光线宽测量 |
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| 摘 要： | 本文报道一个分辨率可达20MH_g的F-P扫描干涉法线宽测试实验系统.该系统调试简便、重复性好,可以用于LD高速调制和线宽压缩中的谱线分析.文中还详细讨论了测量定标方法.
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| 关 键 词： | 线宽测量 半导体激光器 F-P干涉腔 |
High Resolution Linewidtb Measusement Using an F-P Cavity |
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| Li Zhenhua Zhang Jun Lin Zhiyuan. High Resolution Linewidtb Measusement Using an F-P Cavity[J]. Journal of Electron Devices, 1991, 0(2) |
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| Authors: | Li Zhenhua Zhang Jun Lin Zhiyuan |
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| Affiliation: | Li Zhenhua Zhang Jun Lin Zhiyuan |
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| Abstract: | This paper reports a seanning F-P cavity linewith measusement system which has resolution capability of 20MHZ. The system is easy to adjust, and has good reproduction quality. It can be used in the spectral line studies in high frequency modulation and linewidth reduction. Calibrating methods are discussed in detail. |
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| Keywords: | Linewidth measusement semiconductor Laser F-P cavity . |
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