Drift reduction in ion-sensitive FETs using correlated double sampling |
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Authors: | Premanode B. Silawan N. Toumazou C. |
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Affiliation: | Inst. of Biomed. Eng., London; |
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Abstract: | A discrete-time technique, correlated double sampling (CDS), as a method to reduce drift during ion-sensitive field effect transistor (ISFET) operation is presented. The CDS technique exploits switched capacitors to resolve low-frequency signal errors such as drift and 1/f noise, which are generated by an ISFET and its readout. In conjunction with post-processing, experimental results confirm drift reduction using this technique. |
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