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Structural characterization and optical properties of thermally evaporated AgSb0.75In0.25Se2 thin films
Affiliation:1. College of Life Science, Jiangxi Normal University, Nanchang, Jiangxi 330022, China;2. College of Chemistry and Chemical Engineering, Central South University, Changsha, Hunan 410083, China;3. College of Chemistry and Chemical Engineering, Hunan Institute of Science and Technology, Yueyang, Hunan 414006, China;1. School of Chemistry & Physics, University of KwaZulu-Natal, Pietermaritzburg Campus, Private Bag X01, Scottsville 3209, South Africa;2. Department of Physics and Engineering Physics, Obafemi Awolowo University Ile-Ife, Nigeria;1. Department of Material Science and Engineering, Yonsei University, 262 Seong Sanno, Seodaemun-gu, Seoul 120-749, Republic of Korea;2. Eugene Technology Materials, 304 Sinwon-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do 443-380, Republic of Korea;3. R&D Division SK Hynix, 209 Gyeongchung-daero, Bubal-eub, Icheon-si, Gyeonggi-do 467-701 Republic of Korea;1. State Key Discipline Laboratory of Wide BandGap Semiconductor Technology, School of Microelectronics, Xidian University, Xi''an 710071, PR China;2. School of Physics and Optoelectronic Engineering, Xidian University, Xi''an 710071, PR China;3. Faculty of Science, University of Paris-Sud, Paris 91400, France;4. Faculty of Information Engineering & Automation, Kunming University of Science and Technology, Kunming 650051, PR China
Abstract:
Keywords:Chalcogenide material  Thin films  Structure properties  Optical properties
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