Surface Diffusion |
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| Authors: | A Kapoor R T Yang C Wong |
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| Affiliation: | 1. Department of Chemical Engineering , State University of New York at Buffalo , Buffalo, New York, 14260;2. Physical Chemistry Department , General Motors Research Laboratories , Warren, Michigan, 48090 |
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| Abstract: | Advances in instrumentation have made it possible in recent years to study the microstructure of inorganic materials at atomic resolution using the technique of high-resolution electron microscopy (HREM). Details of instrumentation have been described elsewhere l], and applications and trends for HREM have recently been reviewed 2]. Although HREM is primarily a technique for studying bulk defects, it is increasingly also being applied in the profile-imaging mode to derive information about surfaces 3]. The high spatial resolution of the electron microscope makes it a valuable tool for the characterization of heterogeneous catalysts. This is evidenced by the growing number of studies wherein electron micrographs are being used to describe the morphology of a particular catalyst. Profile imaging is proving particularly useful in this regard for following changes in surface structure as a function of treatment conditions 4]. |
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