Characteristics of pulse plated ZnTe films |
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Authors: | K R Murali P Richards Rajkumar |
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Affiliation: | (1) Electrochemical Materials Science Division, Central Electrochemical research Institute, Karaikudi, 630 006 |
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Abstract: | Stoichiometric films of ZnTe are electrodeposited on stainless steel and conducting glass substrates from an aqueous solution
consisting of ZnSO4 (50 mM), TeO2 (17 μM) and H2SO4 to maintain a pH of 2.5. Structure, morphology, composition, and optical are studied using XRD, SEM, EDAX and optical transmittance
spectroscopy The films are composed of small crystallites (50 nm) with cubic crystal structure. The films were polycrystalline
in nature with peaks corresponding to the cubic phase. Direct band gap of 2.30 eV was observed. XPS studiers indicated the
formation of ZnTe. EDAX measurements were made on the films and it was found that there was a slight excess of Te. AFM studies
indicated a surface roughness of 15 nm and a crystallite size of 10–50 nm. |
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