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大口径光学元件面形检测中重叠激光光斑的分离
引用本文:王利,熊召,陈念年,高敏,杨程.大口径光学元件面形检测中重叠激光光斑的分离[J].计算机测量与控制,2012,20(3):621-623,626.
作者姓名:王利  熊召  陈念年  高敏  杨程
作者单位:1. 西南科技大学计算机科学与技术学院,四川绵阳,621010
2. 中国工程物理研究院激光聚变研究中心,四川绵阳,621900
基金项目:国家自然科学基金(10776028);四川省教育厅基金项目(10ZC010);西南科技大学青年预研基金(10zx3110)
摘    要:在大口径光学元件面形检测系统中,激光光斑的检测及后续处理是基础,直接影响面形检测的精度;针对光学元件面形检测中激光光斑重叠的问题,提出了一种激光光斑重叠分离算法;该算法首先用一种减背景与乘法滤波相结合的方法对光斑图像进行预处理,再用两次阈值法分割图像以获取光斑目标,最后采用距离变换、重叠判别及估算圆心相结合来分离重叠的光斑;实验中,对3种重叠类型不同的光斑进行分离,结果表明,算法能有效地分离重叠的激光光斑;目前,该算法通过长时间的实验验证与改进,已成功运用于实际项目中.

关 键 词:光学元件面形检测  激光光斑  乘法滤波  二次分割  重叠分离

Segmentation for Overlapped Laser Spot in Large Optical Components Topography Measurement System
Wang Li , Xiong Zhao , Chen Niannian , Gao Min , Yang Cheng.Segmentation for Overlapped Laser Spot in Large Optical Components Topography Measurement System[J].Computer Measurement & Control,2012,20(3):621-623,626.
Authors:Wang Li  Xiong Zhao  Chen Niannian  Gao Min  Yang Cheng
Affiliation:1(1.Department of Computer Science and Technology,SWUST,Mianyang 621010,China; 2.Research Center of Laser Fuscon,CAEP,Mianyang 621900,China)
Abstract:In the large optical components topography measurement system,the accuracy of the topography measurement is based on the measurement and treatment of laser spot.To aim at the problem of overlapped laser spot in optical component topography measurement,a overlapped laser spot segmentation is proposed.First,a method combine background subtraction with multiplicative filtration is presented to preprocess the laser spot image;then,a twice-segmentation method is used to segment the image to acquire laser spot;finally,a method combine distance transform with overlapping detection and estimate the centre of a circle is proposed to segment overlapped laser spot.In the experiment,three different overlapped laser spots are segmented,results demonstrate the segmention of overlapped laser spot is reached efficiently.At present,the algorithm is used in actual project successfully through a long time of verificafion and improvement.
Keywords:optical components topography measurement  laser spot  multiplicative filtration  twice-segmentation  overlapping segmentation
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