Incorporation of crystallographic temperature factors in the statistical analysis of protein tertiary structures |
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Authors: | Bott Richard; Frane James |
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Affiliation: | Genencor Inc. 180 Kimball Way, South San Francisco, CA 94080, USA
1Genencor Inc. 460 Pt San Bruno Blvd, South San Francisco, CA 94080, USA |
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Abstract: | A method to identify statistically significant differences betweenequivalent atoms in two closely related protein X-ray crystallographicstructures is described. This method uses the linear relationshipfound between the logarithm of the distance between equivalentatoms and their mean temperature factor to determine, by linearregression, the expected difference and variance. |
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Keywords: | X-ray crystallography/ site-specific variant structure |
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