Modulations in structural and ferroelectric properties due to tensile strain in BiFeO3 films on MgAl2O4 substrates induced by thermal-expansion

The effect of tensile strain on structural and ferroelectric properties of BiFeO₃ epitaxial films was investigated. The films grown by pulsed laser deposition on MgAl₂O₄ (0 0 1) substrates revealed monoclinic structure deviated from the bulk rhombohedral structure due to a tensile strain along the in-plane direction. The strain is induced by the difference in thermal expansion coefficients between the film and the substrate. A Poisson ratio is calculated from the in-plain and out-of-plain lattice constants at different temperatures measured by reciprocal space maps of X-ray diffraction. The small Poisson ratio compared to the bulk suggests a weaker elastic response at high temperature. The ferroelectric polarization of the tensile-strained film along the (0 0 1) is also decreased from the bulk value.